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PDF Solutions(r) and TIBCO Spotfire(r) Strategic Alliance Unveils dataPOWER(r) VSF for Visual, Interactive Yield Management
Tuesday, June 30, 2009 8:02 AM


Accelerated Yield Insight and Higher Engineering Productivity Enabled by Rich Semiconductor Capabilities Delivered On An Easy-to-Use Analytics Platform

SAN JOSE, Calif., June 30, 2009 (GLOBE NEWSWIRE) -- PDF Solutions, Inc. (Nasdaq:PDFS), the leading provider of yield improvement technologies and services for the IC manufacturing process life cycle, today introduced an innovative yield management solution called dataPOWER(r) VSF. The result of a strategic alliance with TIBCO Software Inc., dataPOWER(r) VSF is designed to provide a new, higher degree of intuitive and powerful yield analysis and visualization capabilities to the semiconductor and photovoltaic industries.

dataPOWER(r) VSF brings a striking degree of visual interactivity to the analysis of high volume, complex semiconductor data. This interactivity allows users to more rapidly gain insight into the outliers, trends and relationships that determine the performance, quality and speed-to-market of cutting edge semiconductor products. Questions of the data can be asked and answered in rapid visual strokes, using intuitive dynamic filtering, live aggregation, on-the-fly hierarchies, custom KPIs and visual drill-down.

dataPOWER(r) VSF is a highly-optimized query interface to PDF's dataPOWER database, custom-developed, semiconductor-specific visualizations and native Spotfire(r) visualizations that enable semiconductor customers to perform rapid-fire "what if" analysis of their manufacturing data. dataPOWER(r) VSF ships with pre-defined templates that will help users get started quickly. These can be extended, or new ones created instantly via "drag and drop" so that any data investigator, not just power users, can get to root cause quickly and confidently. dataPOWER(r) VSF has been designed to provide users unparalleled ease-of-use for interactive visual analysis of sort, test, bin, parametric, defect, metrology, wafer, lot and equipment history, plus process fault classification and other custom data classes in the dataPOWER(r) database.

"The most demanding technical experts in the semiconductor design and manufacturing world have a history of choosing PDF Solutions' products. With the release of dataPOWER(r) VSF, we now make it possible to extend a high degree of analytical power to a much broader audience of technical and managerial users," stated David Joseph, PDF Solutions' Chief Strategy Officer. "This concept of deploying highly application-specific capabilities on an easy-to-use, enterprise analytics platform is a first for the industry.



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