Advantest Corporation (TSE: 6857, NYSE: ATE) today announced that it
will launch a new test solution, dubbed CloudTestingTM
Service (CTS), which utilizes cloud computing technology to offer
cutting-edge test technology for semiconductor device R&D and design
applications. CTS will be a membership service. Scheduled for roll-out
in fall 2012, it will be unveiled at Advantest’s corporate exhibition,
ADVANTEST EXPO 2012, to be held on June 6th - 7th
Over half a century of dynamic growth in the semiconductor industry,
Advantest has played a key role in supporting the industry’s rapid
technological progress with cutting-edge test solutions. The speed of
technological advance shows no signs of slackening, while device
manufacturers continue to hone the efficiency of their R&D operations.
Advantest’s new CTS is a revolutionary new concept in test, targeted
precisely to these customer needs.
Marrying Advantest’s best-in-class test expertise with cloud computing
technology, CTS requires customers to provide nothing more than a PC and
an internet connection. Test software developed by Advantest (including
test applications and evaluation / analysis tools) can then be
downloaded from the cloud. A dedicated small-size CloudTestingTM
Station terminal, provided to each customer by Advantest, plugs into the
customer’s PC to generate an on-demand test environment precisely
calibrated to their needs.
Compared to conventional testers, CTS is easily upgradable, while its
radically lower cost and smaller footprint make it ideal for R&D and
prototyping applications. The service will be initially rolled out with
test applications and analysis and display tools for logic IC test, and
will be rapidly expanded to cover analog IC and memory IC test.
All information supplied in this release is correct at the time of
publication, but may be subject to change.